Resist Surface Roughness Calculated using Theoretical Percolation Model.

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Surface Roughness Prediction Model Using Ann & Anfis

Now a days the general manufacturing problem can be described as the achievement of a predefined product quality with given equipment, cost and time constraints. There is a rapid development in the quality of advanced aero space materials like aluminum and its alloys with improved properties. The difficulties in machining of these materials economically and effectively are limiting their applic...

متن کامل

Surface Tension Driven Transport Using Roughness

Surface tension, a line force, is a unique type of force, which scales directly to length. When the dimension of interest shrinks down to sub-millimeter range, the size range typical for MEMS devices, surface-tension force becomes dominant over most other forces, such as those based on pressure (surface force) or mass (body force), e.g., see [1,2]. This dominance of surface tension has most typ...

متن کامل

A theoretical study of benzaldehyde derivatives as tyrosinase inhibitors using Ab initio calculated NQCC parameters

Tyrosinase is a multifunctional copper-containing enzyme. It can catalyze two distinct reactions of melanin synthesis and benzaldehyde derivatives, which are potential tyrosinase inhibitors.  To find the relationships between charge distributions of benzaldehyde and their pharmaceutical behavior, the present study aimed at investigating nuclear quadrupole coupling constants of quadrupolare nucl...

متن کامل

Profile Measurement of Resist Surface Using Multi-Array-Probe System

Semiconductor processing in manufacturing must be fast and highly accurate in the measuring of the surface profile of soft thin films such as photoresist. Since photoresist surface is very smooth and deformable, a device to measure is required that will measure vertical direction with a nanometer resolution in height and not damage the film during the measurement. To do this, we developed an ap...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Photopolymer Science and Technology

سال: 1998

ISSN: 0914-9244,1349-6336

DOI: 10.2494/photopolymer.11.571